Website: Sanwood
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Walk-In AB-Series High Temperature Aging Test Chamber

Ramping up semiconductor and active electronic hardware verification to high-volume manufacturing lines typically presents an infrastructure dilemma: installing multiple distinct chambers consumes excessive cleanroom footprints and doubles facility maintenance overheads, while single oversized installations suffer from extreme utility waste during lower-capacity R&D pilot runs.

Sanwood's Walk-In AB-Series High Temperature Aging Test Chamber completely shatters this operational bottleneck. Engineered with a revolutionary dual-zone merged framework, this high-capacity system delivers an expansive internal workspace equivalent to two standard walk-in chambers combined. Operating as a flexible climatic test chamber, the AB-Series features an interlocking pneumatic isolation bulkhead that permits laboratory managers to run the unit as one synchronized, massive thermal testing hall for extra-large hardware assets, or instantly decouple it into two completely independent, asynchronously programmed testing zones.

This versatile architecture provides uncompromised environmental test chamber precision up to 150℃, maximizing cleanroom utility ROI and allowing testing teams to handle high-mix, high-volume production screening sequences simultaneously.

walk-in aging test chamber

Walk-In AB-Series High Temperature Aging Test Chamber (Dual-Zone Decoupled Modular Configuration)

Walk-In AB-Series High Temperature Aging Test Chamber

Advanced Technical Advantages


  • Dual-Zone Asynchronous Thermodynamic Decoupling: Incorporates dual independent, fully isolated heating loop sub-systems and airflow management controllers, allowing Zone A and Zone B to execute completely mismatched thermal ramp profiles up to 150°C without inter-zone thermal bleeding.
  • Interlocking Pneumatic Isolation Bulkhead: Deploys a modular, heavy-duty insulated partition wall driven by precision pneumatic actuators and dual-path high-temperature inflatable seals, enabling rapid conversion from two isolated workspaces into one single combined testing hallg.
  • Symmetrical Dual-Vector Cross-Flow Fluidics: Features synchronized left-and-right centrifugal blower arrays linked to a balanced center-pull extraction system, guaranteeing that even when merged, uniform horizontal laminar airflow forces its way through high-impedance slot cages.

  • Adaptive Dual-Bank Power Load Shaking: Integrates localized smart predictive PID algorithms that instantly scale active power draws depending on operational configuration—running only a single sub-rack zone at half-load utility during low-volume product runs.
Walk-In AB-Series High Temperature Aging Test Chamber

Targeted Application Architecture


  • Massive AI Server Clusters & Full-Rack Compute Infrastructure: Operates the merged unified chamber configuration to accommodate dual full-scale active server cabinets simultaneously, actively neutralizing heavy operational power loads during high-throughput IOPS stress test sequences. 

  • High-Volume Semiconductor Fabless & OSAT Lot Qualification: Runs asynchronous independent HTOL aging batches across separated Zone A and Zone B, allowing QA engineers to test entirely different chip architectures and packaging footprints on parallel multi-layer backplanes. 

  • EV Battery String Arrays & Multi-Module Traction Inverters: Utilizes the long-span combined chamber space to validate multi-meter automotive lithium-ion battery modules and high-power traction inverter chassis against relentless thermomechanical heat retention boundaries.

  • High-Density Enterprise Storage Matrix & NVMe SSD Arrays: Houses thousands of active enterprise storage drive cards across flexible slot cage configurations, tracking parameter degradation windows and FTL status loops without micro-climate stratification.


Walk-In AB-Series High Temperature Aging Test Chamber

The Test Standards Of The Test Chamber


  • JEDEC JESD22-A108F: High Temperature Operating Life (HTOL) (Controls uniform continuous bias profiling inside either decoupled sub-zones or the unified expanded climatic test chamber volume to evaluate transistor degradation arcs).
  • MIL-STD-883K Method 1015.11: Burn-In Test for Microelectronics (Outlines extreme steady-state heat profiles across the dual-rack modular environmental test chamber framework to surface latent component packaging delamination flaws).
  • AEC-Q100 Test Group D: Semiconductor Analytical Lifetime Testing (Configures long-term high-temperature accelerated degradation testing inside the modular climatic test chamber to trace multi-channel parametric drift under load).

  • IEC 60068-2-2: Environmental Testing - Dry Heat (Benchmarks spatial temperature alignment and cross-zone thermal leakage boundaries across the environmental test chamber asynchronous operational modes).
  • ISO 16750-4 Section 5.1: Environmental Conditions for Road Vehicles (Specifies extended heat storage validation for heavy automotive sub-assemblies inside the merged large-scale climatic test chamber framework).


Walk-In AB-Series High Temperature Aging Test Chamber

Control System Of The Test Chamber

The control system of the Sanwood test chamber adopts the world's leading software and hardware system to ensure that the test chamber operates under preset conditions, provide accurate and reliable experimental data, and help users achieve precise control and data collection of various experimental conditions.

  • Controller: It adopts the controller imported from South Korea Sanwon and the self-developed control system, which can be equipped with Siemens control system and equipped with RS232, RS485 and Ethernet communication ports.
  • Programmable control: It supports setting experimental programs, such as heating, cooling, constant temperature time, etc., and can execute multiple program settings, and supports advance reservation startup function.
  • Multiple languages optional: English, Korean, Russian and Japanese.
  • Remote monitoring: Using network remote technology to achieve remote control, the test chamber can be monitored at any time, and the current data can be viewed through the user's PC and mobile phone, which improves the convenience of testing.

The specific control system of the test chamber will vary depending on the model. Please read the "Sanwood Environmental Test Chamber Manual" carefully before use and comply with the safety operating procedures.

Walk-In AB-Series High Temperature Aging Test Chamber

Refrigeration System Of The Test Chamber

The refrigeration system of the test chamber is a complex and important system. The stability of the refrigeration system is crucial to the accuracy and reliability of the test results.

  • Sanwood Technology has developed a refrigerant hot gas defrosting technology, which effectively melts the frost on the evaporator by injecting high-temperature and high-pressure refrigerant steam into the heat exchanger in the test chamber. This not only ensures that the evaporator does not frost, but also greatly reduces the energy consumption of the equipment.
  • The refrigeration unit adopts an internationally renowned brand.
  • Optimize the layout of the refrigeration system, and adopt VRF (refrigerant flow control) technology based on the PID cold end output principle to achieve low-temperature energy-saving operation, which can reduce energy consumption by 30% under low-temperature conditions.
  • The refrigeration system adopts a modular design, with low failure rate, few welding points, high refrigeration efficiency, good reliability, simple maintenance, and low maintenance cost.


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